Measurement of high-quality diffraction data with a Nonius KappaCCD diffractometer: finding the optimal experimental parameters

Henning Osholm Sørensen, Sine Larsen

15 Citations (Scopus)

Original language	English
Journal	Journal of Applied Crystallography
Issue number	36
Pages (from-to)	931-939
ISSN	0021-8898
Publication status	Published - 2003

Cite this

@article{188a7cb074c511dbbee902004c4f4f50,

title = "Measurement of high-quality diffraction data with a Nonius KappaCCD diffractometer: finding the optimal experimental parameters",

author = "S{\o}rensen, {Henning Osholm} and Sine Larsen",

year = "2003",

language = "English",

pages = "931--939",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "Wiley-Blackwell",

number = "36",

}