Measurement of high-quality diffraction data with a Nonius KappaCCD diffractometer: finding the optimal experimental parameters

Henning Osholm Sørensen, Sine Larsen

15 Citationer (Scopus)
OriginalsprogEngelsk
TidsskriftJournal of Applied Crystallography
Udgave nummer36
Sider (fra-til)931-939
ISSN0021-8898
StatusUdgivet - 2003

Citationsformater