Originalsprog | Engelsk |
---|---|
Tidsskrift | Journal of Applied Crystallography |
Udgave nummer | 36 |
Sider (fra-til) | 931-939 |
ISSN | 0021-8898 |
Status | Udgivet - 2003 |
Measurement of high-quality diffraction data with a Nonius KappaCCD diffractometer: finding the optimal experimental parameters
Henning Osholm Sørensen, Sine Larsen
15
Citationer
(Scopus)