Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

Rawa Tanta, Caroline Lindberg, Sebastian Lehmann, Jessica Bolinsson, Miguel R. Carro-Temboury, Kimberly A. Dick, Tom Vosch, Thomas Sand Jespersen, Jesper Nygard

2 Citations (Scopus)

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