Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

Rawa Tanta; Caroline Lindberg; Sebastian Lehmann; Jessica Bolinsson; Miguel R. Carro-Temboury; Kimberly A. Dick; Tom Vosch; Thomas Sand Jespersen; Jesper Nygard

doi:10.1103/PhysRevB.96.165433

Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

Rawa Tanta, Caroline Lindberg, Sebastian Lehmann, Jessica Bolinsson, Miguel R. Carro-Temboury, Kimberly A. Dick, Tom Vosch, Thomas Sand Jespersen, Jesper Nygard

2 Citations (Scopus)

Original language	English
Article number	165433
Journal	Physical Review B
Volume	96
Issue number	16
ISSN	2469-9950
DOIs	https://doi.org/10.1103/PhysRevB.96.165433
Publication status	Published - 19 Oct 2017

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PhysRevB.96.165433Final published version, 1.89 MB

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title = "Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires",

author = "Rawa Tanta and Caroline Lindberg and Sebastian Lehmann and Jessica Bolinsson and Carro-Temboury, {Miguel R.} and Dick, {Kimberly A.} and Tom Vosch and Jespersen, {Thomas Sand} and Jesper Nygard",

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AU - Tanta, Rawa

AU - Lindberg, Caroline

AU - Lehmann, Sebastian

AU - Bolinsson, Jessica

AU - Carro-Temboury, Miguel R.

AU - Dick, Kimberly A.

AU - Vosch, Tom

AU - Jespersen, Thomas Sand

AU - Nygard, Jesper

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PY - 2017/10/19

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DO - 10.1103/PhysRevB.96.165433

M3 - Journal article

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VL - 96

JO - Physical Review B

JF - Physical Review B

IS - 16

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ER -

Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

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