Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

Rawa Tanta; Caroline Lindberg; Sebastian Lehmann; Jessica Bolinsson; Miguel R. Carro-Temboury; Kimberly A. Dick; Tom Vosch; Thomas Sand Jespersen; Jesper Nygard

doi:10.1103/PhysRevB.96.165433

Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

Rawa Tanta, Caroline Lindberg, Sebastian Lehmann, Jessica Bolinsson, Miguel R. Carro-Temboury, Kimberly A. Dick, Tom Vosch, Thomas Sand Jespersen, Jesper Nygard

2 Citationer (Scopus)

Originalsprog	Engelsk
Artikelnummer	165433
Tidsskrift	Physical Review B
Vol/bind	96
Udgave nummer	16
ISSN	2469-9950
DOI	https://doi.org/10.1103/PhysRevB.96.165433
Status	Udgivet - 19 okt. 2017

Adgang til dokumentet

10.1103/PhysRevB.96.165433

PhysRevB.96.165433Forlagets udgivne version, 1,89 MB

Citationsformater

@article{ccd4bd0fa9ea405d9c5b59ad996b28f6,

title = "Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires",

author = "Rawa Tanta and Caroline Lindberg and Sebastian Lehmann and Jessica Bolinsson and Carro-Temboury, {Miguel R.} and Dick, {Kimberly A.} and Tom Vosch and Jespersen, {Thomas Sand} and Jesper Nygard",

note = "[Qdev]",

year = "2017",

month = oct,

day = "19",

doi = "10.1103/PhysRevB.96.165433",

language = "English",

volume = "96",

journal = "Physical Review B",

issn = "2469-9950",

publisher = "American Physical Society",

number = "16",

}

TY - JOUR

T1 - Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

AU - Tanta, Rawa

AU - Lindberg, Caroline

AU - Lehmann, Sebastian

AU - Bolinsson, Jessica

AU - Carro-Temboury, Miguel R.

AU - Dick, Kimberly A.

AU - Vosch, Tom

AU - Jespersen, Thomas Sand

AU - Nygard, Jesper

N1 - [Qdev]

PY - 2017/10/19

Y1 - 2017/10/19

U2 - 10.1103/PhysRevB.96.165433

DO - 10.1103/PhysRevB.96.165433

M3 - Journal article

SN - 2469-9950

VL - 96

JO - Physical Review B

JF - Physical Review B

IS - 16

M1 - 165433

ER -

Micro-Raman spectroscopy for the detection of stacking fault density in InAs and GaAs nanowires

Adgang til dokumentet

Fingeraftryk

Citationsformater