Measurement of strain in the InGaN/GaN heterogeneous nanostructures

Tomas Stankevic, S. Mickevicius, Mikkel Schou Nielsen, Robert Krarup Feidenhans'l, Olga Kryliouk, Rafal Ciechonski, Giuliano Vescovi, Z. Bi, Anders Mikkelsen, Lars Samuelsen, Carsten Gundlach

18 Citations (Scopus)
Original languageEnglish
JournalJournal of Applied Crystallography
Volume48
Issue numberPart 2
Pages (from-to)344-349
ISSN0021-8898
DOIs
Publication statusPublished - 12 Nov 2015

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