Measurement of strain in the InGaN/GaN heterogeneous nanostructures

Tomas Stankevic, S. Mickevicius, Mikkel Schou Nielsen, Robert Krarup Feidenhans'l, Olga Kryliouk, Rafal Ciechonski, Giuliano Vescovi, Z. Bi, Anders Mikkelsen, Lars Samuelsen, Carsten Gundlach

18 Citationer (Scopus)
OriginalsprogEngelsk
TidsskriftJournal of Applied Crystallography
Vol/bind48
Udgave nummerPart 2
Sider (fra-til)344-349
ISSN0021-8898
DOI
StatusUdgivet - 12 nov. 2015

Citationsformater