High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions

U. Dahmen, E. Johnson, S. Q. Xiao, A. Johansen

5 Citations (Scopus)

Cite this

@article{9ea3b92074c911dbbee902004c4f4f50,

title = "High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions",

author = "U. Dahmen and E. Johnson and Xiao, {S. Q.} and A. Johansen",

note = "OEL",

year = "1997",

language = "English",

pages = "49--52",

journal = "MRS Bulletin",

issn = "0883-7694",

publisher = "Cambridge University Press",

number = "22-8",

}