High-Resolution-Electron-Microscopy Investigation of Nanosize Inclusions

U. Dahmen, E. Johnson, S. Q. Xiao, A. Johansen

    5 Citationer (Scopus)
    OriginalsprogEngelsk
    TidsskriftMRS Bulletin
    Udgave nummer22-8
    Sider (fra-til)49-52
    ISSN0883-7694
    StatusUdgivet - 1997

    Citationsformater