Estimation of sample spacing in stochastic processes

TY - JOUR

T1 - Estimation of sample spacing in stochastic processes

AU - Rønn-Nielsen, Anders

AU - Sporring, Jon

AU - Jensen, Eva B. Vedel

PY - 2017

Y1 - 2017

N2 - Motivated by applications in electron microscopy, we study the situation where a stationary and isotropic random field is observed on two parallel planes with unknown distance. We propose an estimator for this distance. Under the tractable, yet flexible class of Lévy-based random field models, we derive an approximate variance of the estimator. The estimator and the approximate variance perform well in two simulation studies.

AB - Motivated by applications in electron microscopy, we study the situation where a stationary and isotropic random field is observed on two parallel planes with unknown distance. We propose an estimator for this distance. Under the tractable, yet flexible class of Lévy-based random field models, we derive an approximate variance of the estimator. The estimator and the approximate variance perform well in two simulation studies.

U2 - 10.5566/ias.1681

DO - 10.5566/ias.1681

M3 - Journal article

SN - 1580-3139

VL - 36

SP - 43

EP - 49

JO - Image Analysis and Stereology

JF - Image Analysis and Stereology

IS - 1

ER -