Estimation of sample spacing in stochastic processes

Anders Rønn-Nielsen; Jon Sporring; Eva B. Vedel Jensen

doi:10.5566/ias.1681

Estimation of sample spacing in stochastic processes

Anders Rønn-Nielsen, Jon Sporring, Eva B. Vedel Jensen

4 Citationer (Scopus)

101 Downloads (Pure)

Abstract

Motivated by applications in electron microscopy, we study the situation where a stationary and isotropic random field is observed on two parallel planes with unknown distance. We propose an estimator for this distance. Under the tractable, yet flexible class of Lévy-based random field models, we derive an approximate variance of the estimator. The estimator and the approximate variance perform well in two simulation studies.

Originalsprog	Engelsk
Tidsskrift	Image Analysis and Stereology
Vol/bind	36
Udgave nummer	1
Sider (fra-til)	43-49
Antal sider	7
ISSN	1580-3139
DOI	https://doi.org/10.5566/ias.1681
Status	Udgivet - 2017

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10.5566/ias.1681Licens: CC BY-NC

Rønn-Nielsen_2017_EstimationForlagets udgivne version, 1,6 MBLicens: CC BY-NC

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AB - Motivated by applications in electron microscopy, we study the situation where a stationary and isotropic random field is observed on two parallel planes with unknown distance. We propose an estimator for this distance. Under the tractable, yet flexible class of Lévy-based random field models, we derive an approximate variance of the estimator. The estimator and the approximate variance perform well in two simulation studies.

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Estimation of sample spacing in stochastic processes

Abstract

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