CBED crystal polarity analysis of compound semiconductor nanostructures

E. Spiecker, W. Jäger, Erik Johnson, Martin Aagesen, C.B. Sørensen, Poul Erik Lindelof

Original language	English
Journal	Microscopy and Microanalysis
Volume	13
Issue number	Suppl. 3
Pages (from-to)	120-121
Number of pages	2
ISSN	1431-9276
Publication status	Published - 2007
Event	MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V. - Saarbrücken, Germany Duration: 2 Sept 2007 → 7 Sept 2007 Conference number: 33

Conference	MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V.
Number	33
Country/Territory	Germany
City	Saarbrücken
Period	02/09/2007 → 07/09/2007

Cite this

@inproceedings{a80bcaf0beb711dcbee902004c4f4f50,

title = "CBED crystal polarity analysis of compound semiconductor nanostructures",

author = "E. Spiecker and W. J{\"a}ger and Erik Johnson and Martin Aagesen and C.B. S{\o}rensen and Lindelof, {Poul Erik}",

year = "2007",

language = "English",

volume = "13",

pages = "120--121",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl. 3",

note = "MC 2007 : Conference of the DGE, Deutschen Gesellschaft f{\"u}r elektronmikroskopie e.V. ; Conference date: 02-09-2007 Through 07-09-2007",

}

TY - GEN

T1 - CBED crystal polarity analysis of compound semiconductor nanostructures

AU - Spiecker, E.

AU - Jäger, W.

AU - Johnson, Erik

AU - Aagesen, Martin

AU - Sørensen, C.B.

AU - Lindelof, Poul Erik

N1 - Conference code: 33

PY - 2007

Y1 - 2007

M3 - Conference article

SN - 1431-9276

VL - 13

SP - 120

EP - 121

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl. 3

T2 - MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V.

Y2 - 2 September 2007 through 7 September 2007

ER -