CBED crystal polarity analysis of compound semiconductor nanostructures

E. Spiecker, W. Jäger, Erik Johnson, Martin Aagesen, C.B. Sørensen, Poul Erik Lindelof

Originalsprog	Engelsk
Tidsskrift	Microscopy and Microanalysis
Vol/bind	13
Udgave nummer	Suppl. 3
Sider (fra-til)	120-121
Antal sider	2
ISSN	1431-9276
Status	Udgivet - 2007
Begivenhed	MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V. - Saarbrücken, Tyskland Varighed: 2 sep. 2007 → 7 sep. 2007 Konferencens nummer: 33

Konference	MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V.
Nummer	33
Land/Område	Tyskland
By	Saarbrücken
Periode	02/09/2007 → 07/09/2007

Citationsformater

@inproceedings{a80bcaf0beb711dcbee902004c4f4f50,

title = "CBED crystal polarity analysis of compound semiconductor nanostructures",

author = "E. Spiecker and W. J{\"a}ger and Erik Johnson and Martin Aagesen and C.B. S{\o}rensen and Lindelof, {Poul Erik}",

year = "2007",

language = "English",

volume = "13",

pages = "120--121",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl. 3",

note = "MC 2007 : Conference of the DGE, Deutschen Gesellschaft f{\"u}r elektronmikroskopie e.V. ; Conference date: 02-09-2007 Through 07-09-2007",

}

TY - GEN

T1 - CBED crystal polarity analysis of compound semiconductor nanostructures

AU - Spiecker, E.

AU - Jäger, W.

AU - Johnson, Erik

AU - Aagesen, Martin

AU - Sørensen, C.B.

AU - Lindelof, Poul Erik

N1 - Conference code: 33

PY - 2007

Y1 - 2007

M3 - Conference article

SN - 1431-9276

VL - 13

SP - 120

EP - 121

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl. 3

T2 - MC 2007 : Conference of the DGE, Deutschen Gesellschaft für elektronmikroskopie e.V.

Y2 - 2 September 2007 through 7 September 2007

ER -