A technique for positioning nano-particles using an atomic force microscope

L. Theil Hansen, A. Kühle, A.H. Sørensen, J. Bohr, P.E. Lindelof

    118 Citations (Scopus)
    Original languageEnglish
    JournalNanotechnology
    Issue number9
    Pages (from-to)337
    ISSN0957-4484
    Publication statusPublished - 1998

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