@article{9c4f5aa001dd11deb05e000ea68e967b,
title = "Structure of the Buried Metal-Molecule Interface in Organic Thin Film Devices",
abstract = "By use of specular X-ray reflectivity (XR) the structure of a metal-covered organic thin film device is measured with angstrom resolution. The model system is a Langmuir-Blodgett (LB) film, sandwiched between a silicon substrate and a top electrode consisting of 25 {\AA} titanium and 100 {\AA} aluminum. By comparison of XR data for the five-layer Pb2+ arachidate LB film before and after vapor deposition of the Ti/Al top electrode, a detailed account of the structural damage to the organic film at the buried metal-molecule interface is obtained. We find that the organized structure of the two topmost LB layers (5 nm) is completely destroyed due to the metal deposition.",
author = "Hansen, {Christian Rein} and S{\o}rensen, {Thomas Just} and Magni Glyvradal and Jacob Larsen and Eisenhardt, {Sara H.} and Thomas Bj{\o}rnholm and Nielsen, {Martin Meedom} and Feidenhans'l, {Robert Krarup} and Laursen, {Bo Wegge}",
year = "2009",
doi = "10.1021/nl803393m",
language = "English",
volume = "9",
pages = "1052--1057",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "3",
}