Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method

Tine Nielsen; Jesper Dammeyer; Guido Makransky

Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method

Tine Nielsen, Jesper Dammeyer, Guido Makransky

Originalsprog	Engelsk
Publikationsdato	jun. 2016
Antal sider	5
Status	Udgivet - jun. 2016
Begivenhed	Higher Education Conference 2016: THE SCHOLARSHIP OF LEARNING, TEACHING, AND ORGANIZING - Amsterdam University of Applied Sciences, Amsterdam, Holland Varighed: 13 jul. 2016 → 15 jul. 2016 http://www.hec2016.org/

Konference

Konference	Higher Education Conference 2016
Lokation	Amsterdam University of Applied Sciences
Land/Område	Holland
By	Amsterdam
Periode	13/07/2016 → 15/07/2016
Internetadresse	http://www.hec2016.org/

Adgang til dokumentet

http://www.hec2016.org/content/proposals/Abstract%20til%20HE%20final%20uploaded.pdf

Citationsformater

Specific Academic Learning and Exam Self-Efficacy : Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method. / Nielsen, Tine ; Dammeyer, Jesper; Makransky, Guido.

2016. Abstract fra Higher Education Conference 2016, Amsterdam, Holland.

Publikation: Konferencebidrag › Konferenceabstrakt til konference › Forskning › peer review

@conference{990b2cd6b6a947e2ad67b200f65dafdf,

title = "Specific Academic Learning and Exam Self-Efficacy: Construct Validity by Rasch Measurement Models and Differences dependent on University Admittance Method",

author = "Tine Nielsen and Jesper Dammeyer and Guido Makransky",

note = "page 117 of the proceedings for the HEC 2016 conference; Higher Education Conference 2016 : THE SCHOLARSHIP OF LEARNING, TEACHING, AND ORGANIZING, HEC2016 ; Conference date: 13-07-2016 Through 15-07-2016",

year = "2016",

month = jun,

language = "English",

url = "http://www.hec2016.org/",

}