@article{a961a9465cb94824b2216441013a30f5,
title = "Yes, one can obtain better quality structures from routine X-ray data collection",
keywords = "X-ray diffraction results, precision, independent atom model, transferable aspherical atom model, geometric parameters, TLS analysis",
author = "Sanjuan-Szklarz, {W. Fabiola} and Hoser, {Anna A.} and Matthias Gutmann and Madsen, {Anders {\O}stergaard} and Krzysztof Wozniak",
year = "2016",
doi = "10.1107/S2052252515020941",
language = "English",
volume = "3",
pages = "61--70",
journal = "I U Cr J",
issn = "2052-2525",
publisher = "International Union of Crystallography",
}