X-ray tomography using the full complex index of refraction

Mikkel Schou Nielsen, Torsten Lauridsen, M. Thomsen, Torben Haugaard Jensen, Martin Bech, L.B. Christensen, Olsen E. V., Hviid M., Robert Krarup Feidenhans'l, F. Pfeiffer

8 Citations (Scopus)

Abstract

We report on x-ray tomography using the full complex index of refraction recorded with a grating-based x-ray phase-contrast setup. Combining simultaneous absorption and phase-contrast information, the distribution of the full complex index of refraction is determined and depicted in a bivariate graph. A simple multivariable threshold segmentation can be applied offering higher accuracy than with a single-variable threshold segmentation as well as new possibilities for the partial volume analysis and edge detection. It is particularly beneficial for low-contrast systems. In this paper, this concept is demonstrated by experimental results
Original languageEnglish
JournalPhysics in Medicine and Biology
Volume57
Issue number19
Pages (from-to)5971-5979
ISSN0031-9155
DOIs
Publication statusPublished - 7 Oct 2012

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