TEM of free standing InAs nanoplates grown by molecular beam epitaxy

Erik Johnson, Martin Aagesen, C.B. Sørensen, Poul Erik Lindelof, P.E. Spiecker, W. Jäger

Original language	English
Journal	Microscopy and Microanalysis
Volume	13
Issue number	Suppl. 3
Pages (from-to)	322-323
Number of pages	2
ISSN	1431-9276
Publication status	Published - 2007
Event	MC 2007 : DGE, Deutschen Gesellschaft für elektronenmikroskopie - Saarbrücken, Germany Duration: 2 Sept 2007 → 7 Sept 2007 Conference number: 33

Conference	MC 2007 : DGE, Deutschen Gesellschaft für elektronenmikroskopie
Number	33
Country/Territory	Germany
City	Saarbrücken
Period	02/09/2007 → 07/09/2007

Cite this

@inproceedings{1259d070bebb11dcbee902004c4f4f50,

title = "TEM of free standing InAs nanoplates grown by molecular beam epitaxy",

author = "Erik Johnson and Martin Aagesen and C.B. S{\o}rensen and Lindelof, {Poul Erik} and P.E. Spiecker and W. J{\"a}ger",

year = "2007",

language = "English",

volume = "13",

pages = "322--323",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "Suppl. 3",

note = "MC 2007 : DGE, Deutschen Gesellschaft f{\"u}r elektronenmikroskopie ; Conference date: 02-09-2007 Through 07-09-2007",

}

TY - GEN

T1 - TEM of free standing InAs nanoplates grown by molecular beam epitaxy

AU - Johnson, Erik

AU - Aagesen, Martin

AU - Sørensen, C.B.

AU - Lindelof, Poul Erik

AU - Spiecker, P.E.

AU - Jäger, W.

N1 - Conference code: 33

PY - 2007

Y1 - 2007

M3 - Conference article

SN - 1431-9276

VL - 13

SP - 322

EP - 323

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - Suppl. 3

T2 - MC 2007 : DGE, Deutschen Gesellschaft für elektronenmikroskopie

Y2 - 2 September 2007 through 7 September 2007

ER -