TEM and RBS/channelling of nanosized bicrystalline (Pb,Cd) inclusions in Al made by sequential ion implantation

E. Johnson, V.S. Touboltsev, A. Johansen, U. Dahmen, S. Hagège

    18 Citations (Scopus)
    Original languageEnglish
    JournalNucl. Instrum. Meth.B.
    Issue numberB127/128
    Pages (from-to)727-733
    Publication statusPublished - 1997

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