Abstract
We demonstrate super-resolution imaging and readout of solid state defect centers. Multiple nitrogen vacancy centers within 130 nm are resolved. Simultaneous control sequences are performed to demonstrate protection of nearby NV states during readout.
Original language | English |
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Article number | FF1B.3 |
Book series | Conference on Lasers and Electro-Optics |
ISSN | 2160-9020 |
DOIs | |
Publication status | Published - 2018 |
Event | CLEO: QELS_Fundamental Science, CLEO_QELS 2018 - San Jose, United States Duration: 13 May 2018 → 18 May 2018 |
Conference
Conference | CLEO: QELS_Fundamental Science, CLEO_QELS 2018 |
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Country/Territory | United States |
City | San Jose |
Period | 13/05/2018 → 18/05/2018 |