Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry

Y.C. Liu, K Thyd'en, Q Xing, E. Johnson

Abstract

Electron microscopy

Original language	English
Title of host publication	-
Place of Publication	Risø(DK)
Publisher	Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi
Publication date	2005
Edition	-
Pages	273-278
Publication status	Published - 2005

Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry. / Liu, Y.C.; Thyd'en, K; Xing, Q et al.
-. -. ed. Risø(DK): Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi, 2005. p. 273-278.

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Communication

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AU - Johnson, E.

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N2 - Electron microscopy

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BT - -

PB - Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi

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