Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry

Y.C. Liu, K Thyd'en, Q Xing, E. Johnson

Abstract

Electron microscopy

Original language	English
Title of host publication	-
Place of Publication	Risø(DK)
Publisher	Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi
Publication date	2005
Edition	-
Pages	273-278
Publication status	Published - 2005

-. -. ed. Risø(DK) : Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi, 2005. p. 273-278.

Research output: Chapter in Book/Report/Conference proceeding › Book chapter › Communication

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title = "Studies of interfacial microstructure in SOFCs by transmission electron microscopy. In : Solid state electrochemistry",

abstract = "Electron microscopy",

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TY - CHAP

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AU - Liu, Y.C.

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AU - Xing, Q

AU - Johnson, E.

PY - 2005

Y1 - 2005

N2 - Electron microscopy

AB - Electron microscopy

M3 - Book chapter

SP - 273

EP - 278

BT - -

PB - Danmarks Tekniske Universitet, Risø Nationallaboratoriet for Bæredygtig Energi

CY - Risø(DK)

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