Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam

Tomas Stankevic, Dmitry Dzhigaev, Zhaoxia Bi, Max Rose, Anatoly Shabalin, Juliane Reinhardt, Anders Mikkelsen, Lars Samuelson, Gerald Falkenberg, Ivan A. Vartanyants, Robert Feidenhans'l

22 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science