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Salient Point and Scale Detection by Minimum Likelihood
Kim Steenstrup Pedersen
, Marco Loog, Pieter van Dorst
Department of Computer Science
Department of Computer Science
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Keyphrases
Image Content
100%
Image Structure
100%
Linear Scale-space
100%
Partial Derivatives
100%
Random Process
100%
Salient Image
100%
Salient Point Detection
100%
Scale Detection
100%
Scale-space Theory
100%
Unique Image
100%
Engineering
Image Content
50%
Linear Scale
50%
Measurement Scale
50%
Partial Derivative
50%
Random Process
50%
Realization
50%
Mathematics
Partial Derivative
100%
Random Process
100%