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Robust Active Label Correction
Jan Kremer, Fei Sha,
Christian Igel
Department of Computer Science
4
Citations (Scopus)
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Engineering & Materials Science
Labels
100%
Problem-Based Learning
12%
Image classification
11%
Labeling
10%
Maximum likelihood
10%
Convolutional neural networks
9%
Costs
8%
Sampling
7%
Experiments
3%