Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk

Dirk Müter; Henning Osholm Sørensen; Diwaker Jha; Ralph Patrick Harti; Kim Nicole Dalby; H. Suhonen; Robert Krarup Feidenhans'l; F. Engstrøm; Susan Louise Svane Stipp

doi:10.1063/1.4891965

Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk

Dirk Müter, Henning Osholm Sørensen, Diwaker Jha, Ralph Patrick Harti, Kim Nicole Dalby, H. Suhonen, Robert Krarup Feidenhans'l, F. Engstrøm, Susan Louise Svane Stipp

30 Citations (Scopus)

Abstract

X-ray computed tomography data from chalk drill cuttings were taken over a series of voxel dimensions, ranging from 320 to 25 nm. From these data sets, standard petrophysical parameters (porosity, surface area, and permeability) were derived and we examined the effect of the voxel dimension (i.e., image resolution) on these properties. We found that for the higher voxel dimensions, they are severely over or underestimated, whereas for 50 and 25 nm voxel dimension, the resulting values (5%-30% porosity, 0.2-2 m²/g specific surface area, and 0.06-0.34 mD permeability) are within the expected range for this type of rock. We compared our results to macroscopic measurements and in the case of surface area, also to measurements using the Brunauer-Emmett-Teller (BET) method and found that independent of the degree of compaction, the results from tomography amount to about 30% of the BET method. Finally, we concluded that at 25 nm voxel dimension, the essential features of the nanoscopic pore network in chalk are captured but better resolution is still needed to derive surface area.

Original language	English
Article number	043108
Journal	Applied Physics Letters
Volume	105
Number of pages	5
ISSN	0003-6951
DOIs	https://doi.org/10.1063/1.4891965
Publication status	Published - 28 Jul 2014

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@article{ed379de4664f4f43b7e4a5a2d9699ac5,

title = "Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk",

abstract = "X-ray computed tomography data from chalk drill cuttings were taken over a series of voxel dimensions, ranging from 320 to 25 nm. From these data sets, standard petrophysical parameters (porosity, surface area, and permeability) were derived and we examined the effect of the voxel dimension (i.e., image resolution) on these properties. We found that for the higher voxel dimensions, they are severely over or underestimated, whereas for 50 and 25 nm voxel dimension, the resulting values (5%-30% porosity, 0.2-2 m2/g specific surface area, and 0.06-0.34 mD permeability) are within the expected range for this type of rock. We compared our results to macroscopic measurements and in the case of surface area, also to measurements using the Brunauer-Emmett-Teller (BET) method and found that independent of the degree of compaction, the results from tomography amount to about 30% of the BET method. Finally, we concluded that at 25 nm voxel dimension, the essential features of the nanoscopic pore network in chalk are captured but better resolution is still needed to derive surface area.",

author = "Dirk M{\"u}ter and S{\o}rensen, {Henning Osholm} and Diwaker Jha and Harti, {Ralph Patrick} and Dalby, {Kim Nicole} and H. Suhonen and Feidenhans'l, {Robert Krarup} and F. Engstr{\o}m and Stipp, {Susan Louise Svane}",

year = "2014",

month = jul,

day = "28",

doi = "10.1063/1.4891965",

language = "English",

volume = "105",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk

AU - Müter, Dirk

AU - Sørensen, Henning Osholm

AU - Jha, Diwaker

AU - Harti, Ralph Patrick

AU - Dalby, Kim Nicole

AU - Suhonen, H.

AU - Feidenhans'l, Robert Krarup

AU - Engstrøm, F.

AU - Stipp, Susan Louise Svane

PY - 2014/7/28

Y1 - 2014/7/28

N2 - X-ray computed tomography data from chalk drill cuttings were taken over a series of voxel dimensions, ranging from 320 to 25 nm. From these data sets, standard petrophysical parameters (porosity, surface area, and permeability) were derived and we examined the effect of the voxel dimension (i.e., image resolution) on these properties. We found that for the higher voxel dimensions, they are severely over or underestimated, whereas for 50 and 25 nm voxel dimension, the resulting values (5%-30% porosity, 0.2-2 m2/g specific surface area, and 0.06-0.34 mD permeability) are within the expected range for this type of rock. We compared our results to macroscopic measurements and in the case of surface area, also to measurements using the Brunauer-Emmett-Teller (BET) method and found that independent of the degree of compaction, the results from tomography amount to about 30% of the BET method. Finally, we concluded that at 25 nm voxel dimension, the essential features of the nanoscopic pore network in chalk are captured but better resolution is still needed to derive surface area.

AB - X-ray computed tomography data from chalk drill cuttings were taken over a series of voxel dimensions, ranging from 320 to 25 nm. From these data sets, standard petrophysical parameters (porosity, surface area, and permeability) were derived and we examined the effect of the voxel dimension (i.e., image resolution) on these properties. We found that for the higher voxel dimensions, they are severely over or underestimated, whereas for 50 and 25 nm voxel dimension, the resulting values (5%-30% porosity, 0.2-2 m2/g specific surface area, and 0.06-0.34 mD permeability) are within the expected range for this type of rock. We compared our results to macroscopic measurements and in the case of surface area, also to measurements using the Brunauer-Emmett-Teller (BET) method and found that independent of the degree of compaction, the results from tomography amount to about 30% of the BET method. Finally, we concluded that at 25 nm voxel dimension, the essential features of the nanoscopic pore network in chalk are captured but better resolution is still needed to derive surface area.

U2 - 10.1063/1.4891965

DO - 10.1063/1.4891965

M3 - Journal article

SN - 0003-6951

VL - 105

JO - Applied Physics Letters

JF - Applied Physics Letters

M1 - 043108

ER -

Resolution dependence of petrophysical parameters derived from X-ray tomography of chalk

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