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Modeling surface imperfections in thin films and nanostructured surfaces
P. -E. Hansen, J. S. Madsen, S. A. Jensen, M. H. Madsen, M. Karamehmedovic
Condensed Matter Physics
34
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Dive into the research topics of 'Modeling surface imperfections in thin films and nanostructured surfaces'. Together they form a unique fingerprint.
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Mathematics
Surface Modeling
100%
Imperfections
89%
Thin Films
85%
Scatterometry
54%
Gratings
47%
Ellipsometry
25%
Knowledge
15%
Surface Roughness
10%
Silicon
9%
Inverse Method
8%
Periodic Structures
8%
Class
8%
Substrate
7%
White noise
6%
Inverse Problem
5%
Cell
5%
Modeling
4%
Characterization
3%
Engineering & Materials Science
Thin films
64%
Defects
46%
Ellipsometry
22%
Periodic structures
9%
White noise
7%
Inverse problems
7%
Characterization (materials science)
5%
Surface roughness
5%
Silicon
5%
Substrates
4%
Physics & Astronomy
defects
37%
thin films
34%
gratings
24%
ellipsometry
13%
white noise
7%
surface roughness
5%
characterization
3%
cells
3%
silicon
3%
Chemical Compounds
Ellipsometry
37%
Surface
21%
Surface Roughness
17%
Wave
15%
Time
6%