Original language | English |
---|---|
Book series | Topics in Applied Physics |
Volume | 115 |
Pages (from-to) | 169-182 |
Number of pages | 13 |
ISSN | 0303-4216 |
Publication status | Published - 2009 |
Measuring the charge and spin states of electrons on individual dopant atoms in silicon
Søren Erfurt Sass Andresen, Dane R. McCamey
1
Citation
(Scopus)