Imaging electromigration during the formation of break junctions.

TY - JOUR

T1 - Imaging electromigration during the formation of break junctions.

AU - Taychatanapat, Thiti

AU - Bolotin, Kirill I

AU - Kuemmeth, Ferdinand

AU - Ralph, Daniel C

PY - 2007/1/1

Y1 - 2007/1/1

N2 - Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

AB - Using a scanning electron microscope, we make real-time movies of gold nanowires during the process of electromigration. We confirm the importance of using a small series resistance when employing electromigration to make controlled nanometer-scale gaps suitable for molecular-electronics studies. We are also able to estimate the effective temperature experienced by molecular adsorbates on the nanowire during the electromigration process.

U2 - DOI: 10.1021/nl062631i

DO - DOI: 10.1021/nl062631i

M3 - Journal article

SN - 1530-6984

VL - 7

SP - 652

EP - 656

JO - Nano Letters

JF - Nano Letters

IS - 3

ER -