Original language | English |
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Journal | Journal of Applied Crystallography |
Volume | 42 |
Issue number | part 3 |
Pages (from-to) | 369-375 |
Number of pages | 16 |
ISSN | 0021-8898 |
DOIs | |
Publication status | Published - 2009 |
High-resolution three-dimensional reciprocal-space mapping of InAs nanowires
Simon Oddsson Mariager, S. L. Lauridsen, A. Dohn, N. Bovet, C. B. Sørensen, C. M. Schlepuetz, P. R. Willmott, Robert Krarup Feidenhans'l