Directional x-ray dark-field imaging

Torben Haugaard Jensen; Martin Bech; Oliver Bunk; Tilman Donath; Christian David; Robert Krarup Feidenhans'l; Franz Pfeiffer

doi:10.1088/0031-9155/55/12/004

Directional x-ray dark-field imaging

Torben Haugaard Jensen, Martin Bech, Oliver Bunk, Tilman Donath, Christian David, Robert Krarup Feidenhans'l, Franz Pfeiffer

87 Citations (Scopus)

Abstract

We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.

Original language	English
Journal	Physics in Medicine and Biology
Volume	55
Issue number	12
Pages (from-to)	3317-3323
Number of pages	6
ISSN	0031-9155
DOIs	https://doi.org/10.1088/0031-9155/55/12/004
Publication status	Published - 21 Jun 2010

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AU - Jensen, Torben Haugaard

AU - Bech, Martin

AU - Bunk, Oliver

AU - Donath, Tilman

AU - David, Christian

AU - Feidenhans'l, Robert Krarup

AU - Pfeiffer, Franz

PY - 2010/6/21

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N2 - We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.

AB - We introduce a novel x-ray imaging approach that yields information about the local texture of structures smaller than the image pixel resolution inside an object. The approach is based on a recently developed x-ray dark-field imaging technique, using scattering from sub-micron structures in the sample. We show that the method can be used to determine the local angle and degree of orientation of bone, and fibers in a leaf. As the method is based on the use of a conventional x-ray tube we believe that it can have a great impact on medical diagnostics and non-destructive testing applications.

U2 - 10.1088/0031-9155/55/12/004

DO - 10.1088/0031-9155/55/12/004

M3 - Journal article

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SP - 3317

EP - 3323

JO - Physics in Medicine and Biology

JF - Physics in Medicine and Biology

IS - 12

ER -

Directional x-ray dark-field imaging

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