Original language | English |
---|---|
Journal | Applied Physics A: Materials Science & Processing |
Volume | 121 |
Issue number | 3 |
Pages (from-to) | 1243-1250 |
ISSN | 0947-8396 |
DOIs | |
Publication status | Published - 23 Sept 2015 |
Detection of sub-pixel fractures in X-ray dark-field tomography
Torsten Lauridsen, Marian Willner, Martin Bech, Franz Pfeiffer, Robert Feidenhans'l