Coherent X-ray nanodiffraction on single GaAs nanowires

J. Gulden...[et al.], A. Mancuso, Simon Oddsson Mariager, Jana Baltser, Robert Krarup Feidenhans'l, Peter Krogstrup

9 Citations (Scopus)

Abstract

Coherent X-ray nanodiffraction was applied to investigate single GaAs nanowires. Using the nanofocus hard X-ray setup at ID13 of the ESRF, the diffraction signal from isolated nanowires was measured. The diffraction patterns were recorded for different rotations of the sample. These diffraction patterns were then combined to yield three-dimensional information around a Wurzite [101] Bragg peak.

Original languageEnglish
JournalPhysica Status Solidi. A: Applications and Materials Science (Print)
Volume208
Issue number11
Pages (from-to)2495-2498
ISSN1862-6300
DOIs
Publication statusPublished - 1 Nov 2011

Fingerprint

Dive into the research topics of 'Coherent X-ray nanodiffraction on single GaAs nanowires'. Together they form a unique fingerprint.

Cite this