Characterization of carbon nanotubes on insulating substrates using electrostatic force microscopy

Thomas Sand Jespersen; P.E. Lindelof; J. Nygård

doi:10.1063/1.2103836

Characterization of carbon nanotubes on insulating substrates using electrostatic force microscopy

Thomas Sand Jespersen, P.E. Lindelof, J. Nygård

Condensed Matter Physics

Abstract

Experimental Nanophysics

Original language	English
Title of host publication	AIP Conference Proceedings, vol. 786
Publication date	2005
Pages	135-138
DOIs	https://doi.org/10.1063/1.2103836
Publication status	Published - 2005
Event	Electronic Properties of Novel Nanostructures: XIX International Wintersschool/ Euroconference on Electronic Properties of Novel Materials - Duration: 29 Nov 2010 → … Conference number: 786

Conference

Conference	Electronic Properties of Novel Nanostructures: XIX International Wintersschool/ Euroconference on Electronic Properties of Novel Materials
Number	786
Period	29/11/2010 → …

Access to Document

10.1063/1.2103836

Cite this

Jespersen, TS, Lindelof, PE & Nygård, J 2005, Characterization of carbon nanotubes on insulating substrates using electrostatic force microscopy. in AIP Conference Proceedings, vol. 786. pp. 135-138, Electronic Properties of Novel Nanostructures: XIX International Wintersschool/ Euroconference on Electronic Properties of Novel Materials, 29/11/2010. https://doi.org/10.1063/1.2103836

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