Cavity quantum electrodynamics studies with site-controlled InGaAs quantum dots integrated into high quality microcavities: Proceedings of SPIE, the International Society for Optical Engineering, Vol.7947

S. Reitzenstein; C. Schneider; F. Albert; A. Huggenberger; T. Heindel; M. Lermer; Søren Stobbe; P. Weinmann; Peter Lodahl; S. Höfling; M. Kamp; L. Worschech; A. Forschel

doi:10.1117/12.876794

Cavity quantum electrodynamics studies with site-controlled InGaAs quantum dots integrated into high quality microcavities: Proceedings of SPIE, the International Society for Optical Engineering, Vol.7947

S. Reitzenstein, C. Schneider, F. Albert, A. Huggenberger, T. Heindel, M. Lermer, Søren Stobbe, P. Weinmann, Peter Lodahl, S. Höfling, M. Kamp, L. Worschech, A. Forschel

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Original language	English
Publication date	1 Mar 2011
Number of pages	20
DOIs	https://doi.org/10.1117/12.876794
Publication status	Published - 1 Mar 2011

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10.1117/12.876794

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Reitzenstein, S., Schneider, C., Albert, F., Huggenberger, A., Heindel, T., Lermer, M., Stobbe, S., Weinmann, P., Lodahl, P., Höfling, S., Kamp, M., Worschech, L., & Forschel, A. (2011). Cavity quantum electrodynamics studies with site-controlled InGaAs quantum dots integrated into high quality microcavities: Proceedings of SPIE, the International Society for Optical Engineering, Vol.7947. https://doi.org/10.1117/12.876794

Cavity quantum electrodynamics studies with site-controlled InGaAs quantum dots integrated into high quality microcavities : Proceedings of SPIE, the International Society for Optical Engineering, Vol.7947. / Reitzenstein, S.; Schneider, C.; Albert, F. et al.

2011.

Research output: Contribution to conference › Conference abstract for conference › Research › peer-review

Reitzenstein, S, Schneider, C, Albert, F, Huggenberger, A, Heindel, T, Lermer, M, Stobbe, S, Weinmann, P, Lodahl, P, Höfling, S, Kamp, M, Worschech, L & Forschel, A 2011, 'Cavity quantum electrodynamics studies with site-controlled InGaAs quantum dots integrated into high quality microcavities: Proceedings of SPIE, the International Society for Optical Engineering, Vol.7947'. https://doi.org/10.1117/12.876794

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