Original language | English |
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Publication date | 2017 |
Number of pages | 1 |
Publication status | Published - 2017 |
Keywords
- test-retest reliability
- EEG
- ERP
Chengteng Ip, Melanie Ganz, Brice Ozenne, Lasse Sluth, Mikkel Gram, Geoffrey Viardot, Philippe l'Hostis, Philippe Danjou, Gitte Kundsen, Søren Christensen
Original language | English |
---|---|
Publication date | 2017 |
Number of pages | 1 |
Publication status | Published - 2017 |