Keyphrases
Scanning Electron Microscope Image
100%
Accurate Model
100%
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
100%
Registration Method
100%
Model-based Registration
100%
Highly Accurate
100%
Ultrastructure
33%
Electron Microscopy Images
33%
Geometric Structure
33%
Distance Measure
33%
Popular
33%
Multiple Sections
33%
Two Dimensional
33%
Correction Method
33%
Image Registration
33%
Scanning Electron Microscope Imaging
33%
Correction Strategy
33%
Nanometre
33%
Biological Structures
33%
Sub-pixel
33%
Engineering
Focused Ion Beam
100%
Registration Method
100%
Scanning Electron Microscope
100%
Two Dimensional
33%
Nanometre
33%
Similarity
33%
Material Science
Scanning Electron Microscopy
100%
Focused Ion Beam
100%
Earth and Planetary Sciences