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A Highly Accurate Model Based Registration Method for FIB-SEM Images of Neurons
Hans Jacob Teglbjærg Stephensen
,
Sune Darkner
,
Jon Sporring
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Engineering & Materials Science
Focused ion beams
100%
Electron microscopes
68%
Neurons
66%
Scanning
55%
Imaging techniques
36%
Image registration
26%
Pixels
18%