A class of goodness of fit tests for a coupla based on bivariate right-censored data

Per Kragh Andersen, Claus Thorn Ekstrøm, John P. Klein, Youyi Shu, Mei-Jie Zhang

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@article{8ab8df60a1bf11ddb6ae000ea68e967b,

title = "A class of goodness of fit tests for a coupla based on bivariate right-censored data",

author = "Andersen, {Per Kragh} and Ekstr{\o}m, {Claus Thorn} and Klein, {John P.} and Youyi Shu and Mei-Jie Zhang",

year = "2005",

doi = "10.1002/bimj.200410163",

language = "English",

volume = "47",

pages = "815--824",

journal = "Biometrical Journal",

issn = "0323-3847",

publisher = "Wiley - V C H Verlag GmbH & Co. KGaA",

number = "6",

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TY - JOUR

T1 - A class of goodness of fit tests for a coupla based on bivariate right-censored data

AU - Andersen, Per Kragh

AU - Ekstrøm, Claus Thorn

AU - Klein, John P.

AU - Shu, Youyi

AU - Zhang, Mei-Jie

PY - 2005

Y1 - 2005

U2 - 10.1002/bimj.200410163

DO - 10.1002/bimj.200410163

M3 - Journal article

SN - 0323-3847

VL - 47

SP - 815

EP - 824

JO - Biometrical Journal

JF - Biometrical Journal

IS - 6

ER -