Using grating based X-ray contrast modalities for metrology

Jais Andreas Breusch Angel, Torsten Lauridsen, Robert Krarup Feidenhans'l, Mikkel Schou Nielsen, Leonardo De Chiffre

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Abstract

Traditionally, segmentation between multi-materials in CT is only available for cases, where material densities are not close to each other. A novel method called GBI offers a new possibility to overcome this problem, and was evaluated with respect to its metrological performance by comparisons to traceable measurements. The measurement results show that further development related to stability issues on the used CT is needed to create a metrological tool using GBI.

OriginalsprogEngelsk
TitelProceedings of the 14th euspen International Conference : 02/06/14 → 06/06/14, Dubrovnik, Croatia
UdgivelsesstedDubrovnik, Croatia
Publikationsdato2 jun. 2014
Udgaveeuspen
Sider157-160
StatusUdgivet - 2 jun. 2014

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