The use of small-angle X-ray diffraction studies for the analysis of structural features in archaeological samples

T. J. Wess*, M. Drakopoulos, A. Snigirev, J. Wouters, O. Paris, P. Fratzl, M. Collins, J. Hiller, K. Nielsen

*Corresponding author af dette arbejde
71 Citationer (Scopus)

Abstract

X-ray diffraction or scattering analysis provides a powerful non-destructive technique capable of providing important information about the state of archaeological samples in the nanometer length scale. Small-angle diffraction facilities are usually found at synchrotron sources, although the potential of a laboratory source is also described. Specific examples of analysis using X-ray diffraction of historic parchment, archaeological bone, a Central Mexico style pictograph and microdiffraction of calcified tissues are used to show the scope and versatility of the technique. Diffraction data is capable of giving fundamental structural information as well as quantifying the remodelling of structures influenced by environmental factors.

OriginalsprogEngelsk
TidsskriftArchaeometry
Vol/bind43
Udgave nummer1
Sider (fra-til)117-129
Antal sider13
ISSN0003-813X
DOI
StatusUdgivet - feb. 2001

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