Structural aspects of oriented poly(octylphenylthiophene) studied in bulk and sub-micron layers by X-ray diffraction

H.J. Fell, E.J. Samuelsen, M.R. Andersson, Jens Als-Nielsen, G. Grübel, J. Mårdalen

    OriginalsprogEngelsk
    TidsskriftPolymer
    ISSN0032-3861
    StatusUdgivet - 1994

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