Abstract
We describe a flexible technique for fabricating 10-nm-scale devices for use as high-resolution scanning sensors and functional probes. Metallic structures are deposited directly onto atomic force microscope tips by evaporation through nanoscale holes fabricated in a stencil mask. We report on the lithographic capabilities of the technique and discuss progress in one initial application, to make high-spatial-resolution magnetic force sensors.
Originalsprog | Engelsk |
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Tidsskrift | Applied Physics Letters |
Vol/bind | 82 |
Udgave nummer | 7 |
Sider (fra-til) | 1111 |
Antal sider | 3 |
ISSN | 0003-6951 |
DOI | |
Status | Udgivet - 1 jan. 2003 |
Udgivet eksternt | Ja |