Estimating the thickness of ultra thin sections for electron microscopy by image statistics

Jon Sporring, Mahdieh Khanmohammadi, Sune Darkner, Nicoletta Nava, Jens Randel Nyengaard, Eva B. Vedel Jensen

4 Citationer (Scopus)

Fingeraftryk

Dyk ned i forskningsemnerne om 'Estimating the thickness of ultra thin sections for electron microscopy by image statistics'. Sammen danner de et unikt fingeraftryk.

Teknik og materialevidenskab