Directional x-ray dark-field imaging of strongly ordered systems

TY - JOUR

T1 - Directional x-ray dark-field imaging of strongly ordered systems

AU - Jensen....[et al.), Torben Haugaard

AU - Bech, Martin

AU - Feidenhans'l, Robert Krarup

PY - 2010/12/6

Y1 - 2010/12/6

N2 - Recently a novel grating based x-ray imaging approach called directional x-ray dark-field imaging was introduced. Directional x-ray dark-field imaging yields information about the local texture of structures smaller than the pixel size of the imaging system. In this work we extend the theoretical description and data processing schemes for directional dark-field imaging to strongly scattering systems, which could not be described previously. We develop a simple scattering model to account for these recent observations and subsequently demonstrate the model using experimental data. The experimental data includes directional dark-field images of polypropylene fibers and a human tooth slice.

AB - Recently a novel grating based x-ray imaging approach called directional x-ray dark-field imaging was introduced. Directional x-ray dark-field imaging yields information about the local texture of structures smaller than the pixel size of the imaging system. In this work we extend the theoretical description and data processing schemes for directional dark-field imaging to strongly scattering systems, which could not be described previously. We develop a simple scattering model to account for these recent observations and subsequently demonstrate the model using experimental data. The experimental data includes directional dark-field images of polypropylene fibers and a human tooth slice.

U2 - 10.1103/PhysRevB.82.214103

DO - 10.1103/PhysRevB.82.214103

M3 - Journal article

SN - 2469-9950

VL - 82

SP - 214103

JO - Physical Review B

JF - Physical Review B

IS - 21

ER -