Application of the ellipsoid modeling of the average shape of nanosized crystallites in powder diffraction

Anna Katerinopoulou, Tonci Balic Zunic, Lars Fahl Lundegaard

    18 Citationer (Scopus)

    Abstract

    Anisotropic broadening correction in X-ray powder diffraction by an ellipsoidal formula is applied on samples with nanosized crystals. Two cases of minerals with largely anisotropic crystallite shapes are presented. The properly applied formalism not only improves the fitting of the theoretical and observed diffraction diagrams but also gives direct information about realistic crystallite shapes and sizes. The approach is demonstrated using the Rietveld refinement program TOPAS and it is easily adaptable to other similar software.
    OriginalsprogEngelsk
    TidsskriftJournal of Applied Crystallography
    Vol/bind45
    Udgave nummer1
    Sider (fra-til)22-27
    Antal sider6
    ISSN0021-8898
    DOI
    StatusUdgivet - feb. 2012

    Citationsformater