Angle calculations for a (2+3)-type diffractometer: focus on area detectors

C.M. Schleputz, Simon Oddsson Mariager, Robert Krarup Feidenhans'l, P.R. Willmott

29 Citationer (Scopus)

Abstract

Angle calculations for a (2+3)-type diffractometer are presented with comprehensive derivations for both cases of either a vertical or horizontal sample configuration. This work focuses on some particular aspects of using area detectors in surface X-ray diffraction, namely the role of the detector rotation and the direct conversion of the angle-resolved diffraction signal recorded by the detector into a two-dimensional slice through reciprocal space.

OriginalsprogEngelsk
TidsskriftJournal of Applied Crystallography
Vol/bind44
Sider (fra-til)73-83
ISSN0021-8898
DOI
StatusUdgivet - 1 feb. 2011

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