TY - JOUR
T1 - Angle calculations for a (2+3)-type diffractometer
T2 - focus on area detectors
AU - Schleputz, C.M.
AU - Mariager, Simon Oddsson
AU - Feidenhans'l, Robert Krarup
AU - Willmott, P.R.
PY - 2011/2/1
Y1 - 2011/2/1
N2 - Angle calculations for a (2+3)-type diffractometer are presented with comprehensive derivations for both cases of either a vertical or horizontal sample configuration. This work focuses on some particular aspects of using area detectors in surface X-ray diffraction, namely the role of the detector rotation and the direct conversion of the angle-resolved diffraction signal recorded by the detector into a two-dimensional slice through reciprocal space.
AB - Angle calculations for a (2+3)-type diffractometer are presented with comprehensive derivations for both cases of either a vertical or horizontal sample configuration. This work focuses on some particular aspects of using area detectors in surface X-ray diffraction, namely the role of the detector rotation and the direct conversion of the angle-resolved diffraction signal recorded by the detector into a two-dimensional slice through reciprocal space.
U2 - 10.1107/s0021889810048922
DO - 10.1107/s0021889810048922
M3 - Journal article
SN - 0021-8898
VL - 44
SP - 73
EP - 83
JO - Journal of Applied Crystallography
JF - Journal of Applied Crystallography
ER -