Analysis of secondary plant metabolites by indirect desorption electrospray ionization imaging mas spectrometry

TY - JOUR

T1 - Analysis of secondary plant metabolites by indirect desorption electrospray ionization imaging mas spectrometry

AU - Thunig, Ulla Janina Christine

AU - Hansen, Steen Honore'

AU - Janfelt, Christian

PY - 2011/5/1

Y1 - 2011/5/1

N2 - Secondary metabolites in plant material can be imaged in a simple and robust way by creating an imprint of the plant material on a porous Teflon surface. The Teflon surface serves to extract compounds from the plant material for enhanced desorption electrospray ionization imaging analysis, while maintaining the spatial information of the sample. The method, which remedies for limitations in mass spectrometry imaging of compounds embedded in plant material, was demonstrated on leaves and petals of Hypericum perforatum and leaves of Datura stramonium.

AB - Secondary metabolites in plant material can be imaged in a simple and robust way by creating an imprint of the plant material on a porous Teflon surface. The Teflon surface serves to extract compounds from the plant material for enhanced desorption electrospray ionization imaging analysis, while maintaining the spatial information of the sample. The method, which remedies for limitations in mass spectrometry imaging of compounds embedded in plant material, was demonstrated on leaves and petals of Hypericum perforatum and leaves of Datura stramonium.

KW - Former Faculty of Pharmaceutical Sciences

U2 - 10.1021/ac2004967

DO - 10.1021/ac2004967

M3 - Letter

C2 - 21473636

SN - 0003-2700

VL - 83

SP - 3256

EP - 3259

JO - Industrial And Engineering Chemistry Analytical Edition

JF - Industrial And Engineering Chemistry Analytical Edition

ER -