Abstract
We present a convolutional approach to reflection symmetry detection in 2D. Our model, built on the products of complex-valued wavelet convolutions, simplifies previous edge-based pairwise methods. Being parameter-centered, as opposed to feature-centered, it has certain computational advantages when the object sizes are known a priori, as demonstrated in an ellipse detection application. The method outperforms the best-performing algorithm on the CVPR 2013 Symmetry Detection Competition Database in the single-symmetry case. We release code and a new, larger image database.
Originalsprog | Engelsk |
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Tidsskrift | Pattern Recognition Letters |
Vol/bind | 95 |
Sider (fra-til) | 44-50 |
Antal sider | 7 |
ISSN | 0167-8655 |
DOI | |
Status | Udgivet - 1 aug. 2017 |