A convolutional approach to reflection symmetry

Marcelo Cicconet*, Vighnesh Birodkar, Mads Lund, Michael Werman, Davi Geiger

*Corresponding author af dette arbejde
16 Citationer (Scopus)

Abstract

We present a convolutional approach to reflection symmetry detection in 2D. Our model, built on the products of complex-valued wavelet convolutions, simplifies previous edge-based pairwise methods. Being parameter-centered, as opposed to feature-centered, it has certain computational advantages when the object sizes are known a priori, as demonstrated in an ellipse detection application. The method outperforms the best-performing algorithm on the CVPR 2013 Symmetry Detection Competition Database in the single-symmetry case. We release code and a new, larger image database.

OriginalsprogEngelsk
TidsskriftPattern Recognition Letters
Vol/bind95
Sider (fra-til)44-50
Antal sider7
ISSN0167-8655
DOI
StatusUdgivet - 1 aug. 2017

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