Metric learning by directly minimizing the k-NN training error

Konstantin Chernoff, Marco Loog, Mads Nielsen

1 Citation (Scopus)

Abstract

This paper presents an approach for computing global distance metrics that minimize the k-NN leave-one-out (LOO) error. The approach optimizes an energy function that corresponds to a smoothened version of the k-NN LOO error. The generalization of the proposed approach is further improved by controlling the k parameter through a heuristic. Evaluation of the proposed approach on several public datasets showed that it was able to compete with an established state-of-the art approach.

Original languageEnglish
Title of host publication2012 21st International Conference on Pattern Recognition (ICPR)
Number of pages4
PublisherIEEE
Publication date2012
Pages1265-1268
ISBN (Print)978-1-4673-2216-4
Publication statusPublished - 2012
Event21st International Conference on Pattern Recognition - Tsukuba Science City , Japan
Duration: 11 Nov 201215 Nov 2012
Conference number: 21

Conference

Conference21st International Conference on Pattern Recognition
Number21
Country/TerritoryJapan
CityTsukuba Science City
Period11/11/201215/11/2012

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