Advanced Structural Characterization of Organic Thin Films

Yun Gu

Abstract

In this thesis, the structural characterizations of three organic film systems are described. Several X-ray based techniques have been utilized for the characterizations for different research goals.
The structures of N,N',N-trioctyltriazatriangulenium (Oct3-TATA+) salts have
been investigated by optical, surface and X-ray method. We describe the production of Langmuir-Blodgett film and how the absorption spectroscopy is a powerful tool to identify layer of monomer and dimer. X-ray refelctometry has been applied as a method for the study of the multilayer film and interface structure.
A separation of small molecule and polymer layers is indicated by Flory-
Huggins theory for the triisopropylsilylethynl pentacene (TIPS-PEN) and polystyrene blend films. In order to investigate the phase separated layers in the ink-jet printed films, we propose a method to measure diraction Bragg peaks by X-ray standing waves. A preliminary experiment has been shown and the results imply a three-layer TIPS-PEN/PS/TIPS-PEN segregated film.
In the last part of the thesis, the time-resolved X-ray diffraction is applied to the study ferroelectric capacitors of copolymer(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)). The early stage result shows a periodic lattice deformation in direction parallel to the electric field following the driving electric field. The timeresolved X-ray diffraction can be employed to investigate the crystal deformations of switching capacitor dynamically and hysteresis properties simultaneously.
Original languageEnglish
PublisherThe Niels Bohr Institute, Faculty of Science, University of Copenhagen
Number of pages108
Publication statusPublished - 2013

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